The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 1991

Filed:

May. 24, 1989
Applicant:
Inventors:

Masanao Yamamoto, Mobara, JP;

Takaaki Unnai, Mobara, JP;

Shigeru Ehata, Mobara, JP;

Tadaaki Hirai, Koganei, JP;

Kenji Sameshima, Hachioji, JP;

Eikiyu Hiruma, Komae, JP;

Shirou Suzuki, Yokosuka, JP;

Kenkichi Tanioka, Tokyo, JP;

Junichi Yamazaki, Kawasaki, JP;

Keiichi Shidara, Tama, JP;

Assignees:

Hitachi Ltd., Tokyo, JP;

Nippon Hoso Kyokai, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; B05D / ; B05D / ;
U.S. Cl.
CPC ...
313106 ; 313384 ; 313386 ; 313390 ; 427 74 ; 427 77 ;
Abstract

An image pick-up tube and a method of fabricating an image pick-up tube and a target section used therewith, in which the target includes at least a conductive film and a photoconductive film on a substrate for photo-electric conversion, and a signal from the target section is read by an electron beam scanning system. At least a part of the surface area outside the effective scanning region of the electron beam scanning side of the target section is formed of a secondary electron emission dampening layer.


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