The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1991
Filed:
May. 19, 1989
Milo R Johnson, Richardson, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
An apparatus (10) for real-time in-line monitoring of a material (26) comprises a blackbody source (12), a first set of reflective surfaces (17) and a second set of reflective surfaces (38). Electromagnetic radiation (16) is emitted from the blackbody source (12) into the first set of reflective surfaces (17), which directs the radiation to a flow stream or material (26) which is to be tested. The radiation passes through or is reflected from the material (26). A transmission spectrum, resulting from the passage of the radiation through the material (26) or the reflection from the material (26), is then received by the second set of reflective surfaces (38). The second set of reflective surfaces (38) diffracts the transmission spectrum (34-36) and focusses the diffracted spectrum onto a detector (52). The detector (52) provides transmission spectrum data to a microprocessor (58) for comparison to a characteristic spectrum of the material (26) for determination of the necessity of a process adjustment.