The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 1991
Filed:
Feb. 27, 1990
Applicant:
Inventors:
Thomas W Dey, Springwater, NY (US);
Edward M Granger, Rochester, NY (US);
Donald E Vandenberg, Brockport, NY (US);
John G Pitek, Rochester, NY (US);
William D Humbel, Rochester, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ;
Abstract
The Foucault knife-edge test has been traditionally employed for testing a monolithic imaging device, for example, a mirror, to ascertain its characteristics, for example, whether or not it is a source of optical aberrations. The present invention, in contrast to the traditional Foucault employment, discloses a Foucault testing of a segmented optic, thereby significantly extending the utility of the Foucault test.