The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 1991

Filed:

Sep. 09, 1987
Applicant:
Inventors:

John W Berthold, Salem, OH (US);

Stuart E Reed, Homeworth, OH (US);

Assignee:

The Babcock & Wilcox Company, New Orleans, LA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73800 ;
Abstract

A microbend strain gauge comprises a pair of plates having facing offset corrugations which clamp a signal optical fiber therebetween. The optical fiber is coated and a light signal is supplied to one end of the fiber which is read at an opposite end of the fiber by an optical sensor. Modulations in the light are primarily due to a difference in pressure being applied to the fiber by the plates. A second optical fiber, is subjected to the same thermal condition and its light signal compared to the light signal through the signal optical fiber to offset any temperature error introduced into the signal by changes in temperature. Aluminum, polyimide or gold coating increases temperature resistance for the fibers.


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