The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1991
Filed:
Mar. 01, 1989
Applicant:
Inventor:
Jonathan D Cohen, Hanover, MD (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06E / ; G06E / ;
U.S. Cl.
CPC ...
364837 ; 364822 ; 364827 ; 364845 ;
Abstract
An outer product shearing interferometer for an optical source of one-dimensional extent which provides interference between every two points on the source. The interferometer comprises an input plane containing the source, an output plane for observing the outer product, a hologram which imparts the sum of two contributions whose phases are bilinear functions of the spatial coordinates, a two-dimensional Fourier transform system which illuminates the hologram with the transform of light from the input plane, and a one-dimensional Fourier transform system which takes light from the hologram and illuminates the output plane.