The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 1991

Filed:

Oct. 25, 1990
Applicant:
Inventors:

Shigeru Tanimoto, Hachiojishi, JP;

Kouichi Takeuchi, Hachiojishi, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324649 ; 324607 ; 324608 ; 324676 ; 324710 ;
Abstract

An impedance meter with improved measurement accuracy obtained by controlling the level of the signal source. The impedance meter comprises a signal source, feedback amplifier, synchronous detector, A/D and control logic. The source level is maintaind by the control logic at a predetermined value by measuring the output of a synchronous detector and intermittently adjusting the level of the source thereby compensating for variations in test object's impedance. Control logic algorithms employed include successive substitution, bisection and linear interpolation.


Find Patent Forward Citations

Tanimoto, Shigeru. (1991). Source level control for impedance meter (U.S. Patent No. 5019781). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5019781

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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