The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 1991

Filed:

Sep. 12, 1989
Applicant:
Inventor:

Donald E Osten, Bolingbrook, IL (US);

Assignee:

Packard Instrument Company, Downers Grove, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356417 ; 2504581 ; 2504591 ; 356318 ;
Abstract

An improved method and apparatus is provided for performing high sensitivity fluorescence measurements. A liquid sample contained within a cuvette is exposed to exciting radiation in such a way that the radiation is introduced directly to the sample and is restricted from reaching the container walls. The sample container is in the form of a cylindrical cuvette provided with reflector means on the bottom so that any unabsorbed exciting radiation reaching the cuvette bottom is reflected back through the sample solution. Fluorescent radiation emitted by the sample is collected by an ellipsoidal reflector which substantially surrounds the sample container and focuses radiation incident thereupon onto a small area from which it is efficiently sensed by a photodetetor. The optical arrangement realizes significantly improved signal-to-noise and signal-to-background ratios.


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