The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 1991
Filed:
Oct. 21, 1988
Thomas L Ferrell, Knoxville, TN (US);
Robert J Warmack, Knoxville, TN (US);
Robin C Reddick, Louisville, TN (US);
Other;
Abstract
A method and apparatus for photon scanning tunneling microscopy for examining a sample in a sample area on a surface at a subwavelength resolution is disclosed. The method comprises generating a near-field of photons at a surface containing a sample area. The near-field has an area that is larger than the sample area, and the near-field has an exponentially increasing intensity in a direction perpendicular to and towards the surface. The near-field is sampled with a probe which receives photons from that near-field that tunnel from the surface to the probe. The received photons are detected and a detector produces an output signal that is proportional to the number of photons received by the probe. The sample area is scanned with the probe in at least one direction parallel to the surface. While scanning, the probe may be maintained either at a position of a constant near-field intensity or at a position of constant distance from the surface. A photon scanning tunneling microscope for using the method is also disclosed.