The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 1991

Filed:

Dec. 26, 1969
Applicant:
Inventors:

Mark M Meyers, Hamlin, NY (US);

James K Lee, Brighton, NY (US);

Badhri Narayan, Rochester, NY (US);

James E Roddy, Greece, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; H01J / ;
U.S. Cl.
CPC ...
350-691 ; 350-64 ; 350486 ; 250235 ;
Abstract

A method and apparatus is provided for line scanning a beam receiving member, wherein a scanning beam is angularly or laterally displaced to compensate for scan line spacing error. The beam is displaced according to error arising from variation (flutter) in the relative motion of the beam and the beam receiving member, or according to error arising from movement of the receiving member while the scanning beam travels to a start of scan position, or both. Embodiments of beam displacement means include a refracting tilt plate, a reflecting tilt plate, a diffracting tilt plate, and a tilt prism.


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