The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 1991

Filed:

Sep. 15, 1989
Applicant:
Inventors:

Gary Lucas, Fieldside, GB;

Maurice Beck, Altrincham, GB;

Andrew Hunt, Orwell, GB;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324663 ; 324686 ;
Abstract

An apparatus for use in the capacitive measurement of the void fraction in a flowing liquid. An assembly of at least two electrodes is spaced apart around the exterior of the body defining a flow passage such that the capacitance of the electrode assembly is a function of the dielectric constant of material within the passageway. The radial thickness of the body is substantial such that the passageway occupies a portion of the electrostatic field of the electrode assembly which is relatively uniform. The dielectric constant of the body may be substantially equal to the expected dielectric constant of the said liquid. The body may be tubular with the electrode assembly directly supported on the radially outer surface of the tube.


Find Patent Forward Citations

Lucas, Gary. (1991). Capacitive void fraction measurement apparatus (U.S. Patent No. 5017879). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5017879

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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