The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 1991
Filed:
May. 07, 1990
Roger G Dower, Vancouver, British Columbia, CA;
Robert W Acres, Vancouver, British Columbia, CA;
Harold R Davis, Vancouver, British Columbia, CA;
Andrew N Donham, Richmond, British Columbia, CA;
Nader Riahi, Richmond, British Columbia, CA;
Richard W Slamka, Vancouver, British Columbia, CA;
Lechoslaw K Urbaniak, Surrey, British Columbia, CA;
Other;
Abstract
Apparatus is disclosed for detecting irregularities or flaws in seams such as the seams of cans. The apparatus includes means for irradiating the surface of the seam to produce reflected radiation signals, a plurality of radiation sensors, each having a selected field of view of the surface, and each producing sensor output signals dependent on reflected radiation signals received within such field of view. A signal processing means receives sensor output signals for a succession of fields of view along the longitudinal length of the seam and derives therefrom signal data representing a dimensional feature of the seam. Signl comparison means compares such derived data with signal data representing an acceptable dimensional limit and produces a rejection signal in the event that the dimensional feature does not fall within the limit. Means for classifying the nature of an irregularity is also disclosed, as is transport means for the movement of seams though the field of view of the sensors.