The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1991

Filed:

Feb. 17, 1989
Applicant:
Inventor:

C James Corris, Shenandoah, GA (US);

Assignee:

Semtronics Corporation, Peachtree City, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01T / ;
U.S. Cl.
CPC ...
361230 ; 361220 ;
Abstract

A device for monitoring air ionization. The charge build-up and decay monitor uses two metal plates, a first 'floating' plate electrically isolated from the monitoring circuitry and a second 'sensing' plate, to form an air dielectric capacitor of known capacitance. In charge decay mode the floating plate is charged and a second capacitor is connected between the sensing plate and electrical ground, producing a capacitive voltage divider. In charge build-up mode the second capacitor is disconnected and a second air dielectric capacitor of known capacitance is formed between the sensing plate and the ground metal casing of the device, again producing a capacitive voltage divider. The monitoring circuitry measures the charge present on the sensing plate, which is proportional to the charge present on the floating plate, without using failure-prone chopper electrometers or other electromechanical means. Internal monitoring circuitry computes the absolute value of the charge present on the floating plate to avoid the need for parallel processing circuits for positive and negative charges, the accuracy of the measurements are enhanced by the use of a large-valued resistor as part of the monitoring circuit to slow greatly the discharge of the second capacitor. Additional accuracy is obtained by monitoring the decay time between two predetermined voltages occurring on a portion of the decay curve that changes relatively slowly. Using predetermined test voltages also avoids the need to set multiple switches and dials and thereby decreases the possibility of human error in using the device.


Find Patent Forward Citations

Corris, C. (1991). Charge build-up and decay monitor (U.S. Patent No. 5016136). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5016136

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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