The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1991

Filed:

Apr. 10, 1989
Applicant:
Inventors:

Peter F Braunlich, Pullman, WA (US);

Wolfgang Tetzlaff, Pullman, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
250337 ; 2503272 ;
Abstract

Dosimeter reading methods and apparatus particularly useful in the measurement of heavy particle radiation dose exposure, such as from neutrons, protons, and alpha particles among others. The methods include exposing a dosimeter to a radiation environment to be measured. The dosimeter is thereafter stimulated, such as by a laser beam, to cause emission discharges from the dosimeter which are variable and indicative of the amount of ionizing radiation to which the element was exposed. Dosimeter elements which experienced an ionizing event from a heavy particle have higher levels of energy stored therein and produce higher luminescent or other emissions, thus characterizing that element or sample area as an eventful sample area. The number, portion or other measure of the eventful sample areas provides a basis for determining the level of radiation exposure due to the heavy particle or other discernable type of ionizing event. This allows the relatively uniform background radiation caused by gamma rays to independently be measured and the heavy particle radiation to be independently measured.


Find Patent Forward Citations

Braunlich, Peter. (1991). Radiation dosimetry by counting differentially ionized sample areas from (U.S. Patent No. 5015855). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5015855

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