The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1991

Filed:

Sep. 07, 1989
Applicant:
Inventors:

Kurt H Hoppmann, Falls Church, VA (US);

Horst A Schober, Falls Church, VA (US);

Assignee:

Hoppmann Corporation, Chantilly, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2502 / ; 356394 ;
Abstract

A comparing device for comparing major landmarks and the orientation of a master object to like characteristics of test objects includes a plurality of master sensors arranged in a predetermined pattern corresponding to a desired orientation and/or landmarks of a fixed master object for producing an output representative of the orientation of the fixed master object. A plurality of test sensors are arranged in the same pattern as the plurality of master sensors for sensing major landmarks and the orientation of a test object and for producing an output representative of the orientation and major landmarks of the test object. In addition, a comparison device compares the output of the plurality of master sensors to the output of the plurality of test sensors for providing a signal to indicate incorrectness of the test object corresponding to the desired characteristics of the fixed master object and subsequent ejection of the incorrect test object from the processing line.


Find Patent Forward Citations

Loading…