The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 1991

Filed:

Dec. 12, 1989
Applicant:
Inventors:

Akira Sato, Saitama, JP;

Kazuaki Hama, Tokyo, JP;

Makoto Nakao, Tokyo, JP;

Junichi Misawa, Tokyo, JP;

Hiroyuki Suzuki, Kanagawa, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01G / ; G01L / ;
U.S. Cl.
CPC ...
177211 ; 7386265 ;
Abstract

The present invention provides a measuring apparatus comprising a load receiving plate, a frame member enclosing the load receiving plate, and at least four beams coupling the load receiving plate and the frame member to each other, thereby supporting the load receiving plate. The beams are so formed as to deflect at predetermined portions thereof in response to X-, Y- and Z-axial components of a force applied to the load receiving plate under the assumption that a direction perpendicular to the load receiving plate is taken as the Z-axial direction and directions perpendicular to each other in the horizontal plane of the load receiving plate are taken as the X- and Y-axial directions, respectively, and strain gauges are provided at predetermined portions of the beams.


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