The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 1991
Filed:
Jun. 29, 1988
Applicant:
Inventors:
Jacques Lessi, Maule, FR;
Philippe Perreau, Rueil Malmaison, FR;
Daniel Bary, Rueil Malmaison, FR;
Guy Grard, Argenteuil, FR;
Assignee:
Institut Francais du Petrole, Rueil Malmaison, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ; G01B / ; G01B / ;
U.S. Cl.
CPC ...
33557 ; 33552 ; 33558 ; 33560 ; 33783 ; 335552 ;
Abstract
A device and method are provided for measuring the deformations of a sample, with the deformations resulting more particularly from the relaxation of the stresses to which the samples were subjected prior to the measurement, and with the sample having an axis corresponding to a main deformation direction. The device comprises at least five displacement sensors each having a measurement direction, with the measurement directions being substantially perpendicular to the axis of the sample.