The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 1991
Filed:
Dec. 05, 1989
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A pattern recognition apparatus detects a coincidence between an input image pattern and a target pattern. Input image data f.sub.ij are received, where f.sub.ij denotes a concentration of the input image pattern at a picture element i,j on a two-dimensional plane of the input image pattern. Mask data g.sub.uv is stored, where g.sub.uv denotes a concentration of the target pattern at a point u,v on a two-dimensional plane of the target pattern. The mask data g.sub.uv is scanned with respect to the input image data f.sub.ij and a proportional coefficient is computed corresponding to each picture element i,j of the two two-dimensional plane of the input image pattern. The proportional coefficient denotes a ratio between the concentration of the input image data f.sub.ij and the concentration of the mask data g.sub.uv. The input image data f.sub.ij is divided into a plurality of partial templates denoting a two-dimensional subsection of the input image pattern. For each partial template, a proportional evaluation index .sigma..sub.ij is calculated corresponding to each picture element i,j of the two-dimensional plane of the input image pattern. The proportional evaluation index .sigma..sub.ij denotes a degree of dispersion of the proportional coefficients within each partial template. Be examining the dispersion of the proportional coefficients, a pattern coincidence can be detected.