The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 1991
Filed:
Jan. 18, 1990
Dung D Nguyen, Edmonds, WA (US);
The Boeing Company, Seattle, WA (US);
Abstract
A method of and apparatus for determining the actual lateral deviation from the centerline of a runway of an aircraft located outside the normal region covered by a glideslope beam is disclosed. The method comprises the steps of scaling a geometrically developed estimated lateral deviation value (Y.sub.estimate) with a compensation factor (K) and passing the result through a complementary filter. The complementary filter produces an estimated lateral deviation rate value (Y.sub.estimate) that is divided into the actual lateral deviation rate value (Y.sub.actual) produced by the inertial navigation system of the aircraft. The result of the division is the compensation factor (K) that is used to scale the geometrically developed estimated lateral deviation value. Preferably, the compensation factor is filtered by a first order lag filter prior to being used to scale the geometrically developed estimated lateral deviation value. The output of the complementary filter is the desired actual lateral deviation value (Y.sub.actual).