The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1991

Filed:

Jun. 30, 1989
Applicant:
Inventors:

Yoichi Kuboyama, Hachiojishi, JP;

Koichi Yanagawa, Hachiojishi, JP;

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324720 ; 324649 ;
Abstract

For measuring the inductance of a workpiece, a device which includes an inductance meter, respective D.C. and A.C. power sources as well as a guard line circuit. In order to simulate conditions of actual use of the workpiece, the D.C. power source is connected to provide a direct current bias through the workpiece. A measuring current produced by the A.C. power source and applied to the workpiece is detected via the inductance meter. The guard line circuit is coupled so as to prevent any portions of the A.C. measuring signal from undesirably flowing through the D.C. power source.


Find Patent Forward Citations

Kuboyama, Yoichi. (1991). D.c. biasing apparatus (U.S. Patent No. 5014012). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5014012

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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