The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 1991

Filed:

Apr. 01, 1988
Applicant:
Inventors:

Yoshiya Takano, Katsuta, JP;

Yoshikazu Hoshi, Ibaraki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
731181 ; 307515 ; 377 19 ;
Abstract

A measurement range is divided into a plurality of sections, a binary coded signal is generated at each division point, small section signals are generated at a predetermined interval between the binary coded signals, the binary coded signals are weighted by angles, and the small section signals are added or subtracted to or from the weighted signal to interpolate between two binary coded signals. Since the increment signals generated between the adjacent absolute signals is used as an interpolation signal between the absolute signals, the measurement accuracy is enhanced without increasing the number of elements for generating the absolute signals. The measured angle can be accurately read by adding or subtracting the increment signals to and from the weighted signal of the absolute signal.


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