The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 1991

Filed:

Jul. 18, 1989
Applicant:
Inventors:

Ichiro Hirai, Tokyo, JP;

Toru Amano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L / ; H04L / ;
U.S. Cl.
CPC ...
375100 ; 375118 ;
Abstract

A phase-adjusting circuit for adjusting the phase relation between an input data string supplied via input lines includes sync detecting apparatus provided for each of the lines for generating frame sync-detection signals by detecting frame sync signals of the input data strings. Apparatus is provided for detecting a first data string having a largest delay of the input data strings. A phase difference-detecting apparatus detects phase differences between the first and the remaining data strings to produce phase difference signals for such remaining data strings. A line connecting signal-generating apparatus is responsive to the phase difference signal for generating line connecting signals. A variable-delay apparatus is responsive to the phase difference signals for outputting delayed data strings by giving delays to the remaining data strings. A first switching apparatus responsive to the line connecting signals delivers the remaining data strings to the variable-delay apparatus and outputs the first data string in an undelayed state. A second switching apparatus responsive to the line connecting signals delivers the first data string and the delayed data strings to output lines corresponding to the input lines.


Find Patent Forward Citations

Loading…