The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 1991
Filed:
Mar. 01, 1989
Applicant:
Inventor:
Jonathan D Cohen, Hanover, MD (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06E / ; G06G / ; G01B / ;
U.S. Cl.
CPC ...
364837 ; 356353 ; 356345 ; 364827 ;
Abstract
An outer product shearing interferometer for an optical source of one-dimensional extent which provides simultaneous interference between every two points on the source. The interferometer comprises an input plane containing the source, an output plane for observing the outer product, an imaging system between the two planes, and a mask positioned in the transform plane of the imaging system and having slits arranged to effect the desired outer product. The desired outer product results from a simultaneous application of many lateral shears instead of only one at a time.