The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 1991

Filed:

Dec. 13, 1989
Applicant:
Inventors:

Fritz K Preikschat, Bellevue, WA (US);

Ekhard Preikschat, Bellevue, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250574 ; 356336 ;
Abstract

Apparatus and method of analyzing particles contained in a fluent medium. An optical system receives light from a laser, and focuses the light at a focal spot in the fluent medium. Optical pulses resulting from the backscattering of light by particles in the focal spot are detected and used to produce an electrical transit time signal comprising a series of electrical pulses. The length of each electrical pulse corresponds to the time required for a particle to pass through the focal spot. The apparatus also includes a laser Doppler system that receives light from the focal spot region, and produces an electrical velocity signal corresponding to the velocity of particles within such region. A processor receives the transit time and velocity signals, and combines the signals to produce data representing the sizes of particles passing through the focal spot.


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