The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 1991

Filed:

Dec. 27, 1988
Applicant:
Inventors:

Alberto Biasillo, Maine, NY (US);

Richard C Taylor, Warren Center, PA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G05B / ;
U.S. Cl.
CPC ...
36447428 ; 36447406 ; 36416701 ;
Abstract

A lapping machine control system which utilizes a electromechanical probe to generate a signal responsive to the separation of the laps, which also represents the thickness of the part being lapped. The separation signal, which is unsuitable for direct control since it is too noisy, is used with a best fit algorithm to estimate the time to reduce the part to the desired thickness, based on the rate of material removal provided by extrapolated line representing the best fit of the lap separation signal. The machining is terminated when the extrapolated line reaches the intercept of time and thickness.


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