The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 1991

Filed:

Mar. 07, 1989
Applicant:
Inventor:

Juliana Manoliu, Palo Alto, CA (US);

Assignee:

National Semiconductor Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 89 ; 148D / ; 148D / ; 148D / ; 156613 ; 437 59 ; 437 64 ; 437 90 ;
Abstract

A CMOS and bipolar fabrication process wherein a silicon dioxide layer initially formed over a silicon substrate is etched for forming separate collector and base/emitter regions for a bipolar device, and PMOS and NMOS regions for corresponding PMOS and NMOS devices. Buried layer implants are performed using a minimum number of masks, and then an epitaxial layer is grown over the exposed portions of the silicon substrate. The silicon dioxide walls between the devices provide full dielectric isolation between the devices, as well as between the collector and base/emitter regions of the bipolar device. Nonetheless, the oxide wall between the collector and base/emitter of the bipolar device is sufficiently small to allow the buried layer implants to joint under the wall for forming a conventional buried layer for the bipolar device. Because of the oxide walls, the minimum distance between devices may be 0.5 microns or less.


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