The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 1991
Filed:
Jan. 31, 1989
Tokyo Keiki Co., Ltd., Tokyo, JP;
Abstract
An ultrasonic thickness measuring method and apparatus in which an ultrasonic pulse is transmitted from a probe to a material to be measured and resulting multiple reflection pulses from the material to be measured are detected to obtain a time interval between the reflection pulses for measuring the thickness of the material. This method and apparatus features, for example, comprises counting a time from transmission of the ultrasonic pulse to reception of a first reflection pulse from a bottom of the material to be measured; detecting a pulse received within a preset period of time after said first reflection pulse has been received and just before a time corresponding to the counted time has passed, as a second reflection pulse; and counting a time between the reception of the first reflection pulse and the reception of the second reflection pulse to measure the thickness of the material.