The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 1991

Filed:

Mar. 27, 1989
Applicant:
Inventors:

Robert W Brandstetter, Levittown, NY (US);

Benjamin J Pernick, Forest Hills, NY (US);

Nils J Fonneland, Lake Ronkonkoma, NY (US);

Stephen J Caputi, Centerport, NY (US);

Assignee:

Grumman Aerospace Corporation, Bethpage, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06G / ; G02F / ; G01B / ;
U.S. Cl.
CPC ...
364807 ; 350358 ; 356349 ;
Abstract

A system and method is presented for obtaining optical phase and amplitude measurements utilizing an acousto-optical modulator for modulating a laser light beam with a multifrequency electrical signal to form an image that is Fourier transformed and spatially distributed proportional to the frequency components of the electrical signal. An optical component such as a spatial light modulator is located in the Fourier plane and the modulated image is inversely transformed and optically heterodyned to produce a transformed image. The transformed image impinges a photodetector that produces an electrical output signal that is inputted to a network analyzer to measure phase and amplitude of the transformed image. The electrical output signal is compared with a reference signal and deviations from the reference signal provide a quantitative measurement of the phase and amplitude response of the spatial light modulator.


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