The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 1991

Filed:

Jan. 23, 1989
Applicant:
Inventors:

Joji Katsura, Nishinomiya, JP;

Yoshiyuki Takagi, Osaka, JP;

Shigeru Watari, Nara, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
357 40 ; 357 45 ; 357 41 ; 357 68 ; 371 151 ; 371 226 ;
Abstract

A cell containing a test pad is defined as a standard cell, in the same fashion as a logic circuit, and is disposed and wired, together with logic circuit cells, in the internal circuit region excluding the input and output pad regions around the chip by a standard cell system. The cell containing the test pad possesses the pad region for feeding a reference potential in the cell, or the pad region capable of detecting a reference signal, or the layout pattern for expressing an arbitrary code for distinguishing the cell from other cells.


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