The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 1991

Filed:

Dec. 21, 1989
Applicant:
Inventors:

William C Overton, Jr, Los Alamos, NM (US);

David B van Hulsteyn, Santa Fe, NM (US);

Edward R Flynn, Los Alamos, NM (US);

Assignee:

United States Department of Energy, Washington, DC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324248 ; 505846 ;
Abstract

An improved pick-up coil system for use with Superconducting Quantum Interference Device gradiometers and magnetometers involving the use of superconducting plates near conventional pick-up coil arrangements to provide imaging of nearby dipole sources and to deflect environmental magnetic noise away from the pick-up coils. This allows the practice of gradiometry and magnetometry in magnetically unshielded environments. One embodiment uses a hemispherically shaped superconducting plate with interior pick-up coils, allowing brain wave measurements to be made on human patients. another embodiment using flat superconducting plates could be used in non-destructive evaluation of materials.


Find Patent Forward Citations

Overton, Jr, William. (1991). Superconductive imaging surface magnetometer (U.S. Patent No. 5008622). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5008622

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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