The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 16, 1991

Filed:

Jun. 20, 1989
Applicant:
Inventors:

Wolodymyr Czubatyj, Warren, MI (US);

Ronald Himmler, Sterling Heights, MI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
3241 / ; 3241 / ; 3241 / ; 434301 ; 437-8 ;
Abstract

Disclosed is a method of testing ultra large area integrated circuits. The circuit has a plurality of individually addressable elements. The method comprises providing a dispersed chargeable powder with the integrated circuit in proximity to and above the powder. At least one device of the integrated circuit is electrically selected. An electrical potential is applied between the integrated circuit and the dispersed powder. The potential causes the chargeable particles to adhere to substantially only functional selected devices of the integrated circuit, thereby differentiating between functional and non-functional devices.


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