The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1991
Filed:
Oct. 05, 1989
Applicant:
Inventors:
Takeshi Mochizuki, Ibaraki, JP;
Shigenobu Katagiri, Ibaraki, JP;
Minoru Seino, Ibaraki, JP;
Minoru Ohshima, Ibaraki, JP;
Susumu Saito, Ibaraki, JP;
Akira Arimoto, Ibaraki, JP;
Assignees:
Hitachi Koki Co., Ltd., Tokyo, JP;
Hitachi Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; H01J / ;
U.S. Cl.
CPC ...
250235 ; 250236 ; 250205 ; 358481 ; 358457 ; 346108 ;
Abstract
An optical scanner and method in which light beams from a plurality of sources are directed onto a medium to form a composite spot. The relative positions of the beams are detected and changed to change the diameter of the composite spot so that lines formed by such spots appear unbroken. The modulating times, intensities and number of sources of the beams can also be varied to provide a linear relation between the dither matrix and the picture element density.