The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 1991

Filed:

Oct. 30, 1989
Applicant:
Inventor:

Toma Tomoff, 7770 Uberlingen, DE;

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356367 ;
Abstract

A polarimeter for measuring the rotation of optically active samples comprises a light source which generates a measuring light beam, a polarizer mounted for rotation about the beam axis of the measuring light beam, a driving mechanism for reciprocating rotational movement of the polarizer, a sample vessel, an analyzer behind the sample vessel, a photoelectric detector, and balancing means which are controlled by the signal of the photoelectric detector and by which a position can be achieved in which the polarizer and analyzer are arranged substantially crosswise. The balancing means comprises a steeper motor for rotating the polarizer with an adjusting movement superimposed by the reciprocatingly rotational movement by which adjusting movement a quick coarse balancing of the polarizer plane of the measuring light beam relative to a zero position of the analyzer is achieved. Fine measuring means are provided for the fine measuring of the angle between the polarization plane of the analyzer in its zero position and the polarization plane of the coarsely balanced measuring light beam.


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