The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 1991

Filed:

Aug. 31, 1988
Applicant:
Inventors:

Michio Kawai, Funabashi, JP;

Sadahiro Tanaka, Yokohama, JP;

Osamu Osanai, Chiba, JP;

Assignee:

Kao Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01B / ;
U.S. Cl.
CPC ...
356237 ; 356371 ;
Abstract

A surface profile analyzer of the present invention is a device chiefly for analyzing the profile of the skin surface of a human. It has a ring-shaped illuminating device for irradiating a predetermined place of a test surface from all peripheral directions thereof, and an image pick-up device for photographing the test surface illuminated by the ring-shaped illuminating device. A digital signal generating device for converting the image signal of the test surface coming from the image pick-up device into a digital signal is used in conjunction with a computer to analyze the surface profile.


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