The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 1991
Filed:
Apr. 06, 1990
Winfried Markowski, Berlin, DE;
Abstract
Testing machine for the mechanical testing of material samples comprising a first and a second force engagement device, a first and a second sample engagement device, a first force measuring device which is positioned between the first sample engagement device on the one hand and the force by-pass device together with the first force engagement device on the other hand, an actuator to create the force to be applied, a force by-pass device which is connected to the first force engagement device and which tranfers an applied prestress force acting on one of the force engagement devices to the other while by-passing the sample positioned between the two sample engagement devices, whereby the force by-pass device is stiff, the second sample engagement device is, by way of a length adjustment device, slidably mounted in the direction of the application of force relative to the end of the force by-pass device which is not connected to a force engagement device and whereby the length adjustment device is connected to the second force engagement device and the second force engagement device is connected to the actuator which creates the force to be applied whereby a device which defines a prestress force to be applied during testing is connected to the actuator.