The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 1991
Filed:
Jan. 27, 1989
Applicant:
Inventor:
Kouichi Furuta, Nara, JP;
Assignee:
Sharp Kabushiki Kaisha, Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
307303 ; 328167 ; 357 40 ;
Abstract
A semiconductor integrated circuit includes a circuit that has characteristics that can be changed by an electrical signal supplied from the outside of the integrated circuit. An output terminal that is used during the normal action of the semiconductor circuit is used as the output of the filter when testing the characteristics of the filter. A switching from the output terminal during normal action and during testing of the filter is performed by a plural mode switch.
Furuta, Kouichi. (1991). Semiconductor integrated circuit and test method for characteristics (U.S. Patent No. 5004934). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5004934
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