The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 1991

Filed:

Aug. 01, 1988
Applicant:
Inventors:

Shinichi Miyake, Osaka, JP;

Fumihiko Yonemori, Osaka, JP;

Masayuki Kometani, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382-6 ; 382 18 ; 356435 ;
Abstract

A method of detecting undesired microorganisms when cells are cultured in a light permeable container is disclosed. TV camera monitors the image of a well containing microorganisms through a microscope. The output of the TV camera is processed by a picture digital processor so as to count the number of cultured living cells. On the other hand, change of the light absorption of the visible light by the cultured solution is measured. Then the number of undesired microorganisms can be calculated by the number of the living cells and change of the light absorption.


Find Patent Forward Citations

Miyake, Shinichi. (1991). Method for detection of the presence of undesired microorganisms (U.S. Patent No. 5003611). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5003611

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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