The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 1991
Filed:
Aug. 03, 1989
Applicant:
Inventors:
Vance A Deason, Idaho Falls, ID (US);
Michael B Ward, Idaho Falls, ID (US);
Assignee:
The United States of America as represented by the Department of Energy, Washington, DC (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
380 54 ; 342-6 ; 342 42 ; 2502 / ; 35016217 ; 235454 ; 235457 ; 235470 ; 365124 ; 365125 ;
Abstract
A finely detailed defraction grating is applied to an object as an identifier or tag which is unambiguous, difficult to duplicate, or remove and transfer to another item, and can be read and compared with prior readings with relative ease. The exact pattern of the defraction grating is mapped by diffraction moire techniques and recorded for comparison with future readings of the same grating.
Deason, Vance. (1991). Diffraction gratings used as identifying markers (U.S. Patent No. 5003600). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5003600
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile