The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 1991

Filed:

May. 30, 1989
Applicant:
Inventors:

Alain Thevenon, Bretigny/Orge, FR;

Michel Le Clercq, Bois-Le-Roi, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356333 ;
Abstract

A double spectrograph system is disclosed. An entrance slit receives and passes light to be analyzed. A first focusing diffraction grating receives that light. A second focusing diffraction grating receives light reflected by the first focusing diffraction grating. The first and second focusing diffraction gratings both have the characteristic of forming planar substantially anastigmatic spectra. Mounting means keeps the first and second gratings at positions symmetrical about an imaginary plane and with their respective focal planes substantially coincident with each other and the imaginary plane. An exit slit receives the light after it has been reflected by the first grating to the second grating and from the second grating to the exit slit.


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