The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 26, 1991
Filed:
May. 24, 1989
William E Wolf, Chesapeake City, MD (US);
E. I. Du Pont de Nemours and Company, Wilmington, DE (US);
Abstract
The present invention relates to a scanning beam optical processing system which combines Fourier optics with the ability to scan a stationary object plane. A scanning system moves a beam of light over a stationary medium and directs the light to a beam deflector. A descanning position control system re-establishes the beam deflected from the beam deflector along a stationary optical path for optical processing of information obtained from the medium. Hyperbolic lenses are used in the scanning system. The descanning position control system includes a controller comprising a detector for sensing a portion of the beam deflected from the beam deflector and for generating a signal representative of the position thereof and a differential amplifier for comparing the signal representative of the position of the deflected beam of light with a signal representative of the predetermined fixed reference axis for generating a beam deflector drive signal in response thereto.