The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 1991

Filed:

Jan. 10, 1990
Applicant:
Inventors:

David A Wright, Edinburgh, GB;

Alexander T Sutherland, Edinburgh, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K / ;
U.S. Cl.
CPC ...
33702 ; 33503 ; 374141 ; 374142 ; 374179 ;
Abstract

Apparatus with a multi-axis mechanism to perform, say, measurements or tests, has at least one pair of temperature detectors individually for each of selected members of the mechanism, each pair of temperature detectors being arranged to sense temperature differences transversely across the associated member. The required positions of the temperature detectors are predetermined from a preliminary examination of the mechanism, so that the extent and direction of each predetermined aspect of thermal distortion within the mechanism, can be computed from simultaneously detected transverse temperature differences, employing algorithms devised as a result of the preliminary examination of the mechanism. Compensation for corresponding selected errors in the measurements or tests can be calculated from the computed extent and direction of each of the predetermined aspects of thermal distortion within the mechanism.


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