The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 1991
Filed:
Dec. 21, 1989
Applicant:
Inventor:
Keiji Kawasaki, Nagoya, JP;
Assignee:
NGK Insulators, Ltd., Aichi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B / ; G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
367 13 ; 73640 ; 73642 ; 310336 ;
Abstract
An ultrasonic testing method comprises steps of transmitting an ultrasonic wave from a probe to a test article, detecting an internal flaw in the test article by a reflected flaw echo from the internal flaw, and deciding a condition of the detected flaw by comparing and analyzing frequency components of the transmitted ultrasonic wave and the reflected flaw echo. The probe has a curved tip surface which is the same kind as that of a curved incident surface of the test article and has a radius of curvature of 0.5.about.2.0 times the radius of curvature of the curved incident surface of the test article.