The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 19, 1991
Filed:
Nov. 21, 1989
Robert T Constable, Toronto, CA;
Ross M Henkelman, Toronto, CA;
General Electric Company, Milwaukee, WI (US);
Abstract
Truncation artifacts in NMR images are reduced by splicing to the truncated data extrapolated high frequency data derived from the truncated image. The truncated data is Fourier transformed into image space and processed with an edge enhancing filter. The retransformed, filtered data yields edge derived high frequency information that may augment the truncated data. The spliced truncated data and edge enhanced data are then reconstructed into an artifact reduced image. In one embodiment, the edge enhancement is performed by iterative passes of a modified Sigma filter. The spliced data is blended with the truncated data near the regions of the splice by means of a weighted average.