The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 19, 1991

Filed:

Feb. 26, 1990
Applicant:
Inventor:

Sarkis Barkhoudarian, Canoga Park, CA (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250330 ; 2503385 ; 250339 ;
Abstract

An improved leak detection system (10) of the differential absorption type is provided for identifying gas leaks in a test object (12), wherein the improved system (10) provides enhanced resolution and accuracy by compensating for the effects of background gases and the like along the image path. The system utilizes a video camera (18) to generate images of the test object (12) which has been pressurized with a selected gas (14) having strong absorption properties with respect to an illuminating light source (16) of a selected wavelength. Since the absorption bandwidth of the test gas (14) varies with temperature, the gas is preconditioned as by heating such that the temperature of gas leaking to the exterior of the test object (12) will vary with proximity to the test object. The camera (18) observes the pressurized test object in sequence through filters (30, 32) of narrow and broad bandwidth to generate a pair of images which can be electronically compared to isolate upon the test gas (14) located substantially at a specific leakage site or sites on the test object.


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