The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 12, 1991
Filed:
Sep. 05, 1989
Applicant:
Inventors:
Yuji Ito, Chigasaki, JP;
Moritoshi Miyamoto, Kawasaki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250575 ; 356442 ;
Abstract
This specification discloses a particle measuring apparatus characterized by means for passing a particle to be examined to a portion to be examined. First applying means applies an irradiating light from a first direction to the portion to be examined, second applying means applies an irradiating light from a second direction differing from the first direction to the portion to be examined. First and second photometering means photomets the lights radiated from the portion to be examined by the application of lights to the particle to be examined, relative to the first and second applying means, respectively.