The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 1991

Filed:

Mar. 08, 1990
Applicant:
Inventors:

Hideo Kaizu, Tokyo, JP;

Kimihiko Kaneko, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73117 ;
Abstract

An endless belt type bench testing apparatus includes a pair of rotary drums, a flexible endless belt wound over the rotary drums and extending therebetween, and a supporting base disposed between the rotary drums and including an operating surface which faces a portion of the belt with a predetermined clearance gap therebetween. The operating surface is formed with a plurality of discharge ports which communicate with a liquid medium supply source for establishing a hydraulic pressure in a form of a liquid medium layer at the clearance gap. An improved structure is included for ensuring effective generation of a dynamic pressure in a form of the liquid medium layer at the clearance gap.


Find Patent Forward Citations

Loading…