The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 1991

Filed:

Nov. 06, 1989
Applicant:
Inventors:

Marik Balyasny, Burbank, CA (US);

Kenneth B Baldwin, Alta Loma, CA (US);

Assignee:

ITT Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; H01R / ; H01R / ;
U.S. Cl.
CPC ...
3241 / ; 439 70 ; 439264 ;
Abstract

A test clip is provided which has multiple contacts that can engage the leads of a surface mount integrated circuit device whose leads are very closely spaced, while being reliably held down to the circuit device during a test procedure. The test clip has a housing with a recess (72, FIG. 10) that very closely recieves the top of the body of the circuit device (12) to align the clip with the circuit device, the clip being devoid of engagement with the lower part of the device. Instead, the test clip relies solely on frictional engagement of its contacts (24) with the circuit device leads (64) to hold down the test clip. Each contact has a first part (80) that initially lies against a contact-locating outer surface (82) of the housing. Each contact also has a second part (84) that extends below the contact-locating outer surface and that is positioned to be outwardly deflected slightly as it wipes across a circuit device lead, as the test clip is moved directly downwardly against the circuit device.


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