The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 1991

Filed:

Jun. 09, 1987
Applicant:
Inventors:

Andrea J Hausman Hazlitt, Lake Jackson, TX (US);

Warren F Richey, Lake Jackson, TX (US);

Assignee:

The Dow Chemical Company, Midland, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436-2 ; 156626 ; 156627 ; 324 711 ; 356319 ; 422 8202 ; 422 8206 ; 422 8209 ; 436149 ; 436150 ; 436177 ;
Abstract

An apparatus and method are used for determining the cleanliness of an electronic circuit assembly (ECA) such as printed circuit boards (PCB) following noraml cleaning and flux removal processes. The apparatus and method are used to quantitatively measure the ionic and organic contaminants remaining on an ECA. The apparatus utilizes small volumes of isopropanol, a conductivity/resistivity probe and cell and a spectrophotometric analytical instrument. The apparatus generally provides for washing the 'cleaned' of defluxed ECA with a measured volume of isopropanol and thereafter measuring the ionic and organic contaminants in the wash solution. The results can then be compared to a standard.


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