The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 1991

Filed:

Apr. 06, 1989
Applicant:
Inventors:

Kenjiro Katsuragi, Tokyo, JP;

Kouji Nishio, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128648 ; 128652 ; 351208 ;
Abstract

An alignment apparatus of a noncontact type tonometer has a target projecting system for projecting light emitted from a light emitting source to an eye to be tested along the axial line of a fluid discharging nozzle for discharging fluid and forming a target image on the eye, and an alignment light receiving optical system for receiving the target image along the axial line of the nozzle and forming an image of the target image on a light receiving sensor. The alignment apparatus of a noncontact type tonometer is characterized in that the light emitting source comprises a first and a second light emitting sources, the light receiving sensor comprises an area sensor, and the apparatus further has a control unit adapted to detect the positions of the target images of the first and second light emitting sources formed on the area sensor and to output an alignment completion signal when such detected positions are within a preset range on the area sensor.


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