The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 1991

Filed:

Oct. 25, 1989
Applicant:
Inventor:

Yoshimi Shimbara, Hiroshima, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382 50 ; 382 51 ;
Abstract

A method and apparatus for identifying marking holes in an object moving along a conveyor or the like, in which television image signals of the identifying marking holes are classified into signals above and below a threshold level voltage and then made into a monochrome image of the identifying marking holes which is then compared with a pre-memorized image of the marking hole. The invention involves a particular way of selecting the threshold level voltages by using a threshold level voltage from among threshold level voltages used to identify the marking holes in preceding objects according to the frequency of occurrence of the threshold level voltages, and for the threshold level voltage of the second identifying marking hole, initially calculating a target threshold level voltage, and then modifying it if necessary by reference to threshold level voltages used to identify the second marking hole in preceding objects, so as to make the identification of the second hole quicker.


Find Patent Forward Citations

Shimbara, Yoshimi. (1991). Method of and apparatus for detecting objects in an assembly line (U.S. Patent No. 4995091). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4995091

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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