The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 1991
Filed:
Jun. 06, 1990
John Begin, Troy, MI (US);
MagneTek Controls, Clawson, MI (US);
Abstract
An adaptive time period measurement technique which provides full speed for every measurement period with increased resolution afforded from repeated measurements. The time measure is produced by adaptively filtering a number of prior time measures. Each measurement includes a count and a fractional part from a controlled variable delay interposed in the measurement system. This variable delay is controlled over a number of measurements to cover the entire range of one clock cycle, preferably in accordance with a reversed binary progression algorithm. The adaptive filtering is preferably a self-modifying, classic low pass filter with a roll off which depends on the rate of change and direction of change of the measurerd time period. Thus the present invention provides all the resolution feasible based upon the rate of change of the measured quantity.